Tools

Calculate cubic diffraction peak positions and systematic absences.

Import peak positions, compare cubic structures and estimate a lattice parameter.

Calibrate images, measure grains and compare thresholded regions.

Compare Schmid factors and slip activation stresses in FCC crystals.

Calculate two-phase fractions from composition and tie-line endpoints.

Compare separate series, fit selected intervals and inspect residuals from source data or your CSV.

Fit a calibration line, inspect residuals and convert new readings with uncertainty intervals.

Separate scatter from uncertainty and compare independent specimens or matched pairs.

Calculate uncertainty in differences, density and resistivity, including correlated inputs.

Calculate direction-dependent stiffness from a source compliance tensor.

Import engineering stress–strain data, inspect the loading curve and compare fit intervals.

Compare measured strength, scatter and batch differences in the NIST machining experiment.

Import grain size and yield stress, compare fits and inspect residuals.

Calculate stress intensity and critical crack length under an applied stress.

Compare stress–life trends, scatter and specimens that survived the test.

Compare strain–time curves, interval rates and changes in rate.

Compare measured holds, fit relaxation times and inspect residuals.

Calculate Maxwell-model creep and stress relaxation under fixed loading conditions.

Estimate composite modulus, density and specific stiffness from constituent properties.

Compare storage and loss moduli, complex viscosity and crossover frequencies.

Compare viscosity curves, fit flow models and inspect rate-dependent residuals.

Read tie lines, compare phase fractions and follow equilibrium cooling paths.

Use assessed thermodynamics to compare liquid, FCC and HCP phases during cooling.

Compare powder compacts before and after treatment, with dimensional uncertainty and thermal history.

Link rolling and annealing to microstructure and measured strength.

Calculate concentration profiles and penetration depths for one-dimensional diffusion.

Import temperature and diffusivity data, fit an Arrhenius relation and inspect residuals.

Calculate mixing free energy and locate the spinodal instability region.

Calculate the critical radius and energy barrier for spherical nucleation.

Import isothermal fractions, compare fit intervals and transformation times.

Calculate resistivity and Hall coefficients from specimen dimensions and electrical measurements.

Import field and current reversals, then compare carrier density and mobility.

Load ZnO and ITO contact measurements and compare current dependence.

Calculate heat flux and temperature drops across layers and interfaces.

Import B–H or M–H cycles and compare crossings, loop energy and power.

Import battery cycles and compare capacity, energy and efficiency.

Calculate interface reflectance and internal attenuation from source optical constants.

Import spectra, adjust baselines and compare peaks, widths and areas.

Screen published devices against EQE and LT50 requirements, or compare emitter, device and surface changes.

Compare measured efficiency after a molecular or device-stack change.

Compare transistor current and surface measurements before and after treatment.

Change excited-state rates, compare photon yield and timing, and examine density-dependent losses.

Compare excitation density, annihilation and photon yield.

Compare required dimensions, mass and cost under the same load.

Compare density, tensile modulus and yield properties of named LDPE and HDPE grades.

Compare the same service, then change reuse, process inputs and end-of-life assumptions.